Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope

Applied Physics Letters

Volumn 79, Issue 22, 2001, Pages 3678-3680

  Tiedke, S ^a   Schmitz, T ^a   Prume, K ^a   Roelofs, A ^b   Schneller, T ^b   Kall, U ^b   Waser, R ^b   Ganpule, C S ^c   Nagarajan, V ^c   Stanishevsky, A ^c   Ramesh, R ^c  

^a AIXACCT SYSTEMS GMBH   (Germany)

^b RWTH AACHEN UNIVERSITY   (Germany)

^c UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035956096     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1421638     Document Type: Article

References (15)

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