Extrinsic size effect in piezoresponse force microscopy of thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 5, 2007, Pages

  Morozovska, Anna N ^a   Svechnikov, Sergei V ^a   Eliseev, Eugene A ^b   Kalinin, Sergei V ^c  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^b FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34548418423     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.054123     Document Type: Article

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