Misfit strain-film thickness phase diagrams and related electromechanical properties of epitaxial ultra-thin lead zirconate titanate films

Acta Materialia

Volumn 58, Issue 3, 2010, Pages 823-835

  Qiu, Q Y ^a   Mahjoub, R ^a   Alpay, S P ^b   Nagarajan, V ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

Dielectrics; Electroceramics; Ferroelectricity; Phase transformations; Thin films

Indexed keywords

DEPOLARIZATION FIELDS; DIELECTRIC AND PIEZOELECTRIC PROPERTIES; DIELECTRIC PERMITTIVITIES; DIELECTRICS; ELECTROCERAMICS; ELECTROMECHANICAL PROPERTY; EPITAXIAL FERROELECTRIC FILMS; EPITAXIAL THIN FILMS; FERROELASTICS; FERROELECTRIC PHASE; FILM COMPOSITION; IN-PLANE; IN-PLANE STRAINS; INDUCED PHASE TRANSITION; LEAD-ZIRCONATE-TITANATE FILMS; MECHANICAL BOUNDARIES; MICROSTRUCTURAL FEATURES; MICROSTRUCTURAL OPTIMIZATION; MISFIT DISLOCATIONS; MISFIT STRAINS; NON-LINEAR; OUT-OF-PLANE; PARAELECTRICS; PHASE TRANSFORMATION; PIEZOELECTRIC COEFFICIENT; POLYDOMAIN; PZT; PZT FILM; PZT THIN FILM; R PHASE; STRAIN ENGINEERING; THERMODYNAMIC MODEL; THICKNESS OF THE FILM; ULTRA-THIN;

EPITAXIAL FILMS; FERROELECTRIC CERAMICS; FERROELECTRICITY; FILM THICKNESS; INTERMETALLICS; MAGNETIC FILMS; MICROSTRUCTURAL EVOLUTION; PHASE DIAGRAMS; PHASE STABILITY; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; PIEZOELECTRICITY; SEMICONDUCTING LEAD COMPOUNDS; STRAIN;

FERROELECTRIC FILMS;

EID: 72149090686     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2009.09.060     Document Type: Article

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