Size effects in ferroelectric thin films: 180° domains and polarization relaxation

Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 17, 2007, Pages

  Ahluwalia, Rajeev ^a   Srolovitz, David J ^b  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^b YESHIVA UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36649020918     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.174121     Document Type: Article

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