Atomic force microscope based Kelvin probe measurements: Application to an electrochemical reaction

Journal of Physical Chemistry B

Volumn 101, Issue 49, 1997, Pages 10162-10165

  Boehmisch, M ^a   Burmeister, F ^a   Rettenberger, A ^a   Zimmermann, J ^a   Boneberg, J ^a   Leiderer, P ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMISTRY; PHOTOEMISSION; PROBES; TUNGSTEN COMPOUNDS;

KELVIN PROBE MEASUREMENTS;

ATOMIC FORCE MICROSCOPY;

EID: 0031553269     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp9728767     Document Type: Article

References (40)