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Volumn 94, Issue 11, 2010, Pages 1907-1911

Thermal stability of intermediate band behavior in Ti implanted Si

Author keywords

Intermediate band; Ion implantation; Pulsed laser melting; Silicon; Titanium

Indexed keywords

CRYSTALLINE LATTICE; ELECTRICAL MEASUREMENT; ELECTRICAL TRANSPORT PROPERTIES; HIGH DOSE; INTERMEDIATE BANDS; ISOCHRONAL ANNEALING; NEW MATERIAL; PULSED LASER; THERMAL STABILITY; THERMAL-ANNEALING; THERMODYNAMIC EQUILIBRIA;

EID: 77957108147     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2010.06.045     Document Type: Article
Times cited : (11)

References (32)
  • 1
    • 0031164889 scopus 로고    scopus 로고
    • Increasing the efficiency of ideal solar cells by photon induced transitions at intermediate levels
    • A. Luque, and A. Mart Increasing the efficiency of ideal solar cells by photon induced transitions at intermediate levels Physical Review Letters 78 1997 5014 5017
    • (1997) Physical Review Letters , vol.78 , pp. 5014-5017
    • Luque, A.1    Mart, A.2
  • 2
    • 84918194623 scopus 로고
    • Limitations and possibilities for improvement of photovoltaic solar energy converters
    • M. Wolf, Limitations and possibilities for improvement of photovoltaic solar energy converters. Considerations for earth surface operation, Proceedings of the IRE 48 (1960) 12461263.
    • (1960) Considerations for Earth Surface Operation, Proceedings of the IRE , vol.48 , pp. 1246-1263
    • Wolf, M.1
  • 3
    • 0037091425 scopus 로고    scopus 로고
    • Ab initio electronic structure calculations for metallic intermediate band formation in photovoltaics materials
    • P. Wahnón, and C. Tablero Ab initio electronic structure calculations for metallic intermediate band formation in photovoltaics materials Physical Review B 65 2002 165115.110
    • (2002) Physical Review B , vol.65
    • Wahnón, P.1    Tablero, C.2
  • 5
    • 10444258353 scopus 로고    scopus 로고
    • Survey of intermediate band material candidates
    • C. Tablero Survey of intermediate band material candidates Solid State Communications 133 2005 97 101
    • (2005) Solid State Communications , vol.133 , pp. 97-101
    • Tablero, C.1
  • 8
    • 34247376412 scopus 로고    scopus 로고
    • Theoretical modelling of intermediate band solar cell materials based on metal-doped chalcopyrite compounds
    • DOI 10.1016/j.tsf.2006.12.170, PII S0040609006015914
    • P. Palacios, K. Snchez, J.C. Conesa, J.J. Fernndez, and P. Wahnón Theoretical modelling of intermdiate band solar cell materials based on metal-doped chalcopyrite compounds Thin Solid Films 515 2007 6280 6284 (Pubitemid 46635613)
    • (2007) Thin Solid Films , vol.515 , Issue.SPEC. ISS. , pp. 6280-6284
    • Palacios, P.1    Sanchez, K.2    Conesa, J.C.3    Fernandez, J.J.4    Wahnon, P.5
  • 10
    • 24244444170 scopus 로고
    • Absence of diffusion in certain random lattices
    • P.W. Anderson Absence of diffusion in certain random lattices Physical Review 109 1958 1492 1505
    • (1958) Physical Review , vol.109 , pp. 1492-1505
    • Anderson, P.W.1
  • 11
    • 36049053404 scopus 로고
    • Metalinsulator transition
    • N.F. Mott Metalinsulator transition Review of Modern Physics 40 1968 677 683
    • (1968) Review of Modern Physics , vol.40 , pp. 677-683
    • Mott, N.F.1
  • 16
    • 65649102972 scopus 로고    scopus 로고
    • Assessment through first-principles calculations of an intermdiate-band photovoltaic material based on Ti-implanted silicon: Interstitial versus substitutional origin
    • K. Snchez, I. Aguilera, P. Palacios, and P. Wahnón Assessment through first-principles calculations of an intermdiate-band photovoltaic material based on Ti-implanted silicon: interstitial versus substitutional origin Physical Review B 79 2009 165203.17
    • (2009) Physical Review B , vol.79
    • Snchez, K.1    Aguilera, I.2    Palacios, P.3    Wahnón, P.4
  • 17
    • 0018874494 scopus 로고
    • Supersaturated substitutional alloys formed by ion implantation and pulsed laser annealing of group-III and group-V dopants in silicon
    • C.W. White, S.R. Wilson, B.R. Appleton, and F.W. Young Jr Supersaturated substitutional alloys formed by ion implantation and pulsed laser annealing of group-III and group-V dopants in silicon Journal of Applied Physics 51 1980 738 749
    • (1980) Journal of Applied Physics , vol.51 , pp. 738-749
    • White, C.W.1    Wilson, S.R.2    Appleton, B.R.3    Young, Jr.F.W.4
  • 18
    • 18844404955 scopus 로고    scopus 로고
    • Strain compensation in boronindium coimplanted laser thermal processed silicon
    • M.H. Clark, and K.S. Jones Strain compensation in boronindium coimplanted laser thermal processed silicon Journal of Applied Physics 97 2005 093525.14
    • (2005) Journal of Applied Physics , vol.97
    • Clark, M.H.1    Jones, K.S.2
  • 19
    • 64949120526 scopus 로고    scopus 로고
    • Pulsed laser melting effects on single crystal gallium phosphide
    • Santiago de Compostela (Spain)
    • D. Pastor, J. Olea, M. Toledano-Luque, I. Mártil, G. González-Díaz, Pulsed laser melting effects on single crystal gallium phosphide, in: Proceedings of the 7th IEEE Spanish Conference of Electron Devices, Santiago de Compostela (Spain), 2009, pp. 4245.
    • (2009) Proceedings of the 7th IEEE Spanish Conference of Electron Devices , pp. 42-45
    • D. Pastor1
  • 21
    • 0343761837 scopus 로고
    • Silicon processing for the VLSI era
    • Lattice Press Sunset Beach, CA
    • S. Wolf Silicon processing for the VLSI era Process Integration vol. 2 1990 Lattice Press Sunset Beach, CA pp. 121131
    • (1990) Process Integration , vol.2
    • Wolf, S.1
  • 26
    • 64949187952 scopus 로고    scopus 로고
    • High quality Ti-implanted Si layers above solid solubility limit
    • Santiago de Compostela, Spain
    • J. Olea, D. Pastor, M. Toledano-Luque, E. San-Andrs, I. Mártil, G. González-Díaz, High quality Ti-implanted Si layers above solid solubility limit, in: Proceedings of the 7th IEEE Spanish Conference on Electron Devices, Santiago de Compostela, Spain, 2009, pp. 3841.
    • (2009) Proceedings of the 7th IEEE Spanish Conference on Electron Devices , pp. 38-41
    • J. Olea1
  • 32
    • 78650408225 scopus 로고    scopus 로고
    • Raman and Rutherford backscattering characterization of Ti implanted Si above Mott limit
    • Boston, USA, doi: 10.1557/PROC-1210-Q04-10, in press
    • J. Olea, D. Pastor, I. Martil, G. Gonzalez-Diaz, J. Ibaez, R. Cusco, L. Artus, Raman and Rutherford backscattering characterization of Ti implanted Si above Mott limit, in: Proceedings of the 2009 MRS Fall Meeting, Boston, USA, doi: 10.1557/PROC-1210-Q04-10, in press.
    • Proceedings of the 2009 MRS Fall Meeting
    • J. Olea1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.