Electrical resistivity and Hall coefficient of C49, C40, and C54 TiSi 2 thin-film phases

Journal of Applied Physics

Volumn 92, Issue 6, 2002, Pages 3147-3151

  Mammoliti, F ^a   Grimaldi, M G ^a   La Via, F ^b  

^a INFM and Department of Physics   (Italy)

^b CNR IMM   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTION MECHANISM; ELECTRICAL RESISTIVITY; HALL COEFFICIENT; INDEPENDENT VALUES; INTRINSIC DEFECTS; MULTI CARRIER; RESIDUAL RESISTIVITY; SCATTERING LENGTH; TEMPERATURE DECREASE; TEMPERATURE RANGE;

DEBYE TEMPERATURE; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES;

TITANIUM COMPOUNDS;

EID: 18644372990     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1500787     Document Type: Article

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