Few-layer graphene characterization by near-field scanning microwave microscopy

ACS Nano

Volumn 4, Issue 7, 2010, Pages 3831-3838

  Talanov, Vladimir V ^a,d   Barga, Christopher Del ^b   Wickey, Lee ^b   Kalichava, Irakli ^b   Gonzales, Edward ^c   Shaner, Eric A ^c   Gin, Aaron V ^c   Kalugin, Nikolai G ^b  

^a SEMILAB AMS   (United States)

^b NEW MEXICO INSTITUTE OF MINING AND TECHNOLOGY   (United States)

^c SANDIA NATIONAL LABORATORIES   (United States)

^d Neocera Inc   (United States)

Author keywords

graphene; impedance; near field microwave microscopy

Indexed keywords

AC-IMPEDANCE; DEVICE FABRICATIONS; ELECTRICAL PROPERTY; IMPEDANCE; LOCAL IMPEDANCE; MEASUREMENT SYSTEM; MICROWAVE MICROSCOPY; MICROWAVE RESPONSE; NEAR-FIELD; NEAR-FIELD MICROWAVE MICROSCOPY; NEAR-FIELD SCANNING; PROBE GEOMETRY; QUANTITATIVE IMAGING; SIMULTANEOUS IMAGING; SPATIAL SPECTRA; WAVE NUMBERS;

ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; ELECTROMAGNETIC FIELDS; ELECTRON ENERGY LEVELS; GRAPHITE; MAGNETIC FIELD EFFECTS; MICROWAVES; MONOLAYERS; PLASMA WAVES; SCANNING ELECTRON MICROSCOPY;

GRAPHENE;

EID: 77955522929     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn100493f     Document Type: Article

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