Nondestructive imaging of dielectric-constant profiles and ferroelectric domains with a scanning-tip microwave near-field microscope

Science

Volumn 276, Issue 5321, 1997, Pages 2004-2006

  Lu, Yalin ^a   Wei, Tao ^a   Duewer, Fred ^a   Lu, Yanqing ^b   Ming, Nai Ben ^b   Schultz, P G ^a   Xiang, X D ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYSTAL; DIELECTRIC CONSTANT; IMAGE PROCESSING; IMAGING SYSTEM; MICROSCOPY; MICROWAVE RADIATION; PRIORITY JOURNAL;

EID: 0030843305     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.276.5321.2004     Document Type: Article

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19. This work was supported by the director of Advanced Energy Projects Division, Office of Computational and Technology Research, U.S. Department of Energy, under contract DE-AC03-76SF00098.