A near-field scanned microwave probe for spatially localized electrical metrology

Applied Physics Letters

Volumn 88, Issue 13, 2006, Pages

  Talanov, Vladimir V ^a   Scherz, Andrá ^a   Moreland, Robert L ^a   Schwartz, Andrew R ^a  

^a Neocera Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL METROLOGY; NEAR-FIELD SCANNED MICROWAVE PROBES; SPATIAL LOCALIZATION;

APPROXIMATION THEORY; MICROWAVES; RESONATORS; SILICON WAFERS; WSI CIRCUITS;

MICROWAVE MEASUREMENT;

EID: 33645515472     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2189147     Document Type: Article

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