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Volumn 72, Issue 16, 2005, Pages

ac ballistic transport in a two-dimensional electron gas measured in GaAs AlGaAs heterostructures

Author keywords

[No Author keywords available]

Indexed keywords

EID: 29644445493 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.72.165312 Document Type: Article

Times cited : (12)

References (14)

1
- 0003409205
- Cambridge University Press, Cambridge
- S. Datta, Electronic Transport in Mesoscopic Systems (Cambridge University Press, Cambridge, 1995).
- (1995) Electronic Transport in Mesoscopic Systems
- Datta, S.¹

2
- 0033747807
- EDLEDZ 0741-3106 10.1109/55.841309
- Y. Naveh and K. K. Likharev, IEEE Electron Device Lett. EDLEDZ 0741-3106 10.1109/55.841309 21, 242 (2000).
- (2000) IEEE Electron Device Lett. , vol.21 , pp. 242
- Naveh, Y.¹ Likharev, K.K.²

3
- 0000265087
- APPLAB 0003-6951 10.1063/1.120473
- F. G. Pikus and K. K. Likharev, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.120473 71, 3661 (1997).
- (1997) Appl. Phys. Lett. , vol.71 , pp. 3661
- Pikus, F.G.¹ Likharev, K.K.²

4
- 0031191310
- EDLEDZ 0741-3106 10.1109/55.596937
- M. Lundstrom, IEEE Electron Device Lett. EDLEDZ 0741-3106 10.1109/55.596937 18, 361 (1997).
- (1997) IEEE Electron Device Lett. , vol.18 , pp. 361
- Lundstrom, M.¹

5
- 29644446742
- SUMIEK 0749-6036
- S. Datta, F. Assad, and M. S. Lundstrom, Superlattices Microstruct. SUMIEK 0749-6036 25, 625 (1999).
- (1999) Superlattices Microstruct. , vol.25 , pp. 625
- Datta, S.¹ Assad, F.² Lundstrom, M.S.³

6
- 0041761616
- EDLEDZ 0741-3106
- A. Rahman, J. Guo, S. Datta, and M. S. Lundstrom, IEEE Electron Device Lett. EDLEDZ 0741-3106 50, 1853 (2003).
- (2003) IEEE Electron Device Lett. , vol.50 , pp. 1853
- Rahman, A.¹ Guo, J.² Datta, S.³ Lundstrom, M.S.⁴

7
- 0033882240
- EDLEDZ 0741-3106
- F. Assad, Z. B. Ren, D. Vasileska, S. Datta, and M. Lundstrom, IEEE Electron Device Lett. EDLEDZ 0741-3106 47, 232 (2000).
- (2000) IEEE Electron Device Lett. , vol.47 , pp. 232
- Assad, F.¹ Ren, Z.B.² Vasileska, D.³ Datta, S.⁴ Lundstrom, M.⁵

8
- 0036253371
- EDLEDZ 0741-3106
- M. Lundstrom and Z. B. Ren, IEEE Electron Device Lett. EDLEDZ 0741-3106 49, 133 (2002).
- (2002) IEEE Electron Device Lett. , vol.49 , pp. 133
- Lundstrom, M.¹ Ren, Z.B.²

9
- 0033347297
- G. Timp, J. Bude, K. Bourdelle, J. Garno, A. Ghetti, H. Gossmann, M. Green, G. Forsyth, Y. Kim, R. Kleiman, F. Lkemens, A. Kornblit, C. Lochstampfor, W. Mansfield, S. Moccio, T. Sorsch, D. M. Tennant, W. Timp, and R. Tung, IEDM Tech. Digest 99, 55 (1999).
- (1999) IEDM Tech. Digest , vol.99 , pp. 55
- Timp, G.¹ Bude, J.² Bourdelle, K.³ Garno, J.⁴ Ghetti, A.⁵ Gossmann, H.⁶ Green, M.⁷ Forsyth, G.⁸ Kim, Y.⁹ Kleiman, R.¹⁰ Lkemens, F.¹¹ Kornblit, A.¹² Lochstampfor, C.¹³ Mansfield, W.¹⁴ Moccio, S.¹⁵ Sorsch, T.¹⁶ Tennant, D.M.¹⁷ Timp, W.¹⁸ Tung, R.¹⁹

10
- 0036713397
- EDLEDZ 0741-3106 10.1109/LED.2002.802679
- M. S. Shur, IEEE Electron Device Lett. EDLEDZ 0741-3106 10.1109/LED.2002.802679 23, 511 (2002).
- (2002) IEEE Electron Device Lett. , vol.23 , pp. 511
- Shur, M.S.¹

11
- 0034172638
- IETMAB 0018-9480 10.1109/22.841969
- M. S. Shur and J. Q. Lu, IEEE Trans. Microwave Theory Tech. IETMAB 0018-9480 10.1109/22.841969 48, 750 (2000).
- (2000) IEEE Trans. Microwave Theory Tech. , vol.48 , pp. 750
- Shur, M.S.¹ Lu, J.Q.²

12
- 0000430080
- APPLAB 0003-6951 10.1063/1.125881
- P. J. Burke, I. B. Spielman, J. P. Eisenstein, L. N. Pfeiffer, and K. W. West, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.125881 76, 745 (2000).
- (2000) Appl. Phys. Lett. , vol.76 , pp. 745
- Burke, P.J.¹ Spielman, I.B.² Eisenstein, J.P.³ Pfeiffer, L.N.⁴ West, K.W.⁵

13
- 3142708240
- SSELA5 0038-1101
- S. M. Kang, P. J. Burke, L. N. Pfeiffer, and K. W. West, Solid-State Electron. SSELA5 0038-1101 48, 2013 (2004).
- (2004) Solid-State Electron. , vol.48 , pp. 2013
- Kang, S.M.¹ Burke, P.J.² Pfeiffer, L.N.³ West, K.W.⁴

14
- 0038819628
- JAPIAU 0021-8979 10.1063/1.1577405
- V. Ryzhii, A. Satou, and M. S. Shur, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1577405 93, 10041 (2003).
- (2003) J. Appl. Phys. , vol.93 , pp. 10041
- Ryzhii, V.¹ Satou, A.² Shur, M.S.³

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