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Volumn 96, Issue 8, 2010, Pages

Measurements of the sheet resistance and conductivity of thin epitaxial graphene and SiC films

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GRAPHENE; QUASI-TE; ROOM-TEMPERATURE CONDUCTIVITY; SEMI-INSULATING; SIC FILMS; SIC SUBSTRATES;

EID: 77749246044     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3327334     Document Type: Article
Times cited : (110)

References (8)
  • 2
    • 46849117349 scopus 로고    scopus 로고
    • MSTCEP 0957-0233. 10.1088/0957-0233/19/6/065701
    • J. Krupka, Meas. Sci. Technol. MSTCEP 0957-0233 19, 065701 (2008). 10.1088/0957-0233/19/6/065701
    • (2008) Meas. Sci. Technol. , vol.19 , pp. 065701
    • Krupka, J.1
  • 8
    • 0022027295 scopus 로고
    • IETMAB 0018-9480. 10.1109/TMTT.1985.1132999
    • J. Krupka, IEEE Trans. Microwave Theory Tech. IETMAB 0018-9480 MTT-33, 274 (1985). 10.1109/TMTT.1985.1132999
    • (1985) IEEE Trans. Microwave Theory Tech. , vol.33 , pp. 274
    • Krupka, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.