Shear force distance control in a scanning near-field optical microscope: In resonance excitation of the fiber probe versus out of resonance excitation

Ultramicroscopy

Volumn 99, Issue 4, 2004, Pages 227-233

  Lapshin, D A ^a   Letokhov, V S ^a   Shubeita, G T ^b,c   Sekatskii, S K ^b   Dietler, G ^b  

^a INSTITUTE OF SPECTROSCOPY   (Russian Federation)

^b EPFL   (Switzerland)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

07.79.Fc; 19; 46.55.+d; Scanning near field optical microscopy; Shear force

Indexed keywords

ATOMIC FORCE MICROSCOPY; OPTICAL FIBERS; STATIC ELECTRICITY;

FIBER PROBE; RESONANCE EXCITATION; SHEAR FORCE DISTANCE CONTROL; STATIC ATTRACTION FORCE;

OPTICAL MICROSCOPY;

ARTICLE; EXCITATION; FIBER; FORCE; INTERMETHOD COMPARISON; MICROSCOPE; SAMPLE; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SHEAR STRENGTH;

EID: 2442608726     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.01.003     Document Type: Article

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