Novel approach for high-resolution elastic behavior assessment of alloyed strained nanostructures

Journal of Physical Chemistry C

Volumn 114, Issue 29, 2010, Pages 12409-12415

  Montoro, Luciano A ^a   Medeiros Ribeiro, Gilberto ^a,b   Ramirez, Antonio J ^a  

^a LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

^b HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VARIATIONS; ELASTIC BEHAVIOR; ELASTIC ENERGY; ELASTIC STATE; EPITAXIAL ISLANDS; HIGH RESOLUTION; HIGH SPATIAL RESOLUTION; MODEL SYSTEM; SI(0 0 1); STRAIN STATE;

EPITAXIAL FILMS; EPITAXIAL GROWTH; GERMANIUM; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; SILICON;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 77954944582     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp100187u     Document Type: Article

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