Strain mapping in nanowires

Nanotechnology

Volumn 16, Issue 10, 2005, Pages 2365-2371

  Taraci, J L ^a   Hytch M J ^b   Clement, T ^a   Peralta, P ^a   McCartney, M R ^c   Drucker, Jeff ^c   Picraux, S T ^a,d  

^a AZ 85281   (United States)

^b CNRS   (France)

^c ARIZONA STATE UNIVERSITY   (United States)

^d LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORMS; GROWTH (MATERIALS); HIGH RESOLUTION ELECTRON MICROSCOPY; LATTICE CONSTANTS; STRAIN; TRANSMISSION ELECTRON MICROSCOPY;

LATTICE PLANES; NANOWIRES; STRAIN MAPS;

MAPS;

EID: 25444530634     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/10/062     Document Type: Article

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