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Volumn 56, Issue 3, 2010, Pages 827-831

Nitrogen-passivation effects of si substrates on the properties of ZnO epitaxial layers grown by using plasma-assisted molecular beam epitaxy

Author keywords

Atomic force microscopy; Molecular beam epitaxiy; Photoluminescence; X ray diffraction; Zinc oxide

Indexed keywords


EID: 77954838454     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.56.827     Document Type: Article
Times cited : (26)

References (39)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.