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Volumn 516, Issue 23, 2008, Pages 8702-8706
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Temperature dependent photoluminescence characteristics of nanocrystalline ZnO films grown by sol-gel technique
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Author keywords
Photoluminescence; sol gel synthesis; X ray diffraction; ZnO
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Indexed keywords
COLLOIDS;
DIFFRACTION;
ELECTRON DIFFRACTION;
EMISSION SPECTROSCOPY;
GELATION;
GELS;
HOLOGRAPHIC INTERFEROMETRY;
LEAKAGE (FLUID);
LIGHT EMISSION;
LUMINESCENCE;
NANOCRYSTALLINE ALLOYS;
NANOCRYSTALLINE MATERIALS;
NANOSTRUCTURED MATERIALS;
NONMETALS;
OPTICAL PROPERTIES;
OXYGEN;
PHOTOLUMINESCENCE;
QUANTUM EFFICIENCY;
SEMICONDUCTING CADMIUM TELLURIDE;
SEMICONDUCTING SILICON COMPOUNDS;
SEMICONDUCTING ZINC COMPOUNDS;
SILICON;
SOL-GEL PROCESS;
SOL-GELS;
SOLS;
THICK FILMS;
ZINC ALLOYS;
ZINC OXIDE;
ZINC SULFIDE;
ANNEALED FILMS;
GREEN EMISSIONS;
GREEN-BAND EMISSION;
NANOCRYSTALLINE ZNO;
OXYGEN CONTENTS;
PHOTOLUMINESCENCE SPECTRA;
SELECTED-AREA ELECTRON DIFFRACTION;
SHAPED PARTICLES;
SI(100);
SOL-GEL SYNTHESIS;
SOL-GEL TECHNIQUES;
TEMPERATURE DEPENDENT PHOTOLUMINESCENCE;
TEMPERATURE RANGES;
ULTRA-VIOLET;
WURTZITE STRUCTURES;
X-RAY DIFFRACTION;
X-RAY DIFFRACTION PATTERNS;
ZNO;
ZNO FILMS;
ZNO THIN FILMS;
METALLIC FILMS;
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EID: 50849130874
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2008.05.016 Document Type: Article |
Times cited : (51)
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References (38)
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