Multislice theory of fast electron scattering incorporating atomic inner-shell ionization

Ultramicroscopy

Volumn 104, Issue 2, 2005, Pages 141-151

  Dwyer, C ^a,b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Electron energy loss spectroscopy (EELS); Inelastic electron scattering theory; Scanning transmission electron microscopy (STEM)

Indexed keywords

APPROXIMATION THEORY; ELECTRON ENERGY LEVELS; ENERGY DISSIPATION; IONIZATION; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

ANGULAR MOMENTUM; ATOMIC INNER SHELL IONIZATION; DYNAMICAL ELASTIC SCATTERING; INELASTIC SCATTERING;

ELECTRON SCATTERING;

SILICON;

ARTICLE; ELECTRON; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON TRANSPORT; ENERGY CONSUMPTION; FAST ELECTRON RADIATION; IONIZATION; MAXIMUM ALLOWABLE CONCENTRATION; RADIATION SCATTERING; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THEORY;

EID: 20544473020     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.03.005     Document Type: Article

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