Bias potential for tip-plane systems in Kelvin probe force microscopy imaging of non-uniform surface potential distributions

Japanese Journal of Applied Physics

Volumn 49, Issue 2 Part 1, 2010, Pages

  Sajewicz, Krzysztof ^a   Krok, Franciszek ^a   Konior, Jerzy ^a  

^a JAGIELLONIAN UNIVERSITY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS POTENTIAL; EFFICIENT METHOD; FORCE GRADIENTS; INTEGRAL FORMULAS; ISLAND SIZE; KELVIN PROBE FORCE MICROSCOPY; NON-UNIFORM POTENTIAL; NONUNIFORM; POTENTIAL DISTRIBUTIONS; POTENTIAL MAPPING; POTENTIAL STEPS; SURFACE POTENTIAL DISTRIBUTIONS; TIP GEOMETRY; VIBRATION AMPLITUDE;

ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; NANOTIPS;

PROBES;

EID: 77950822816     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.49.025201     Document Type: Article

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