Phase imaging atomic force microscopy in the characterization of biomaterials

Journal of Microscopy

Volumn 238, Issue 1, 2010, Pages 27-35

  Ye, Z ^a,b   Zhao, X ^a,c  

^a SICHUAN UNIVERSITY   (China)

^b PEKING UNIVERSITY   (China)

^c Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

Height image; Inherent roughness; Multi components; Phase image; Tapping mode

Indexed keywords

ATOMIC FORCE MICROSCOPY; PHASE SEPARATION;

ATOMIC-FORCE-MICROSCOPY; CHEMICAL VARIATIONS; HEIGHT IMAGE; INHERENT ROUGHNESS; MULTICOMPONENTS; PHASE IMAGE; PHASE IMAGING; PHASE-CONTRAST; SURFACE CHARACTERIZATION; TAPPING MODES;

BIOMATERIALS;

BIOMATERIAL; NANOFIBER;

ARTICLE; ATOMIC FORCE MICROSCOPY; DIFFERENTIAL SCANNING CALORIMETRY; HUMAN; IMAGING; PHASE SEPARATION; PRIORITY JOURNAL; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77949622855     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2009.03282.x     Document Type: Article

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