Experimental evaluation of probe-sample force in tapping mode scanning force microscopy

Surface and Interface Analysis

Volumn 27, Issue 5, 1999, Pages 374-378

  Matlis, S ^a   Edgar, R ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; ORGANIC COMPOUNDS; SUBLIMATION; SURFACES;

BENZAMIDE; SCANNING FORCE MICROSCOPY; TAPPING MODE;

ATOMIC FORCE MICROSCOPY;

EID: 0032645674     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199905/06)27:5/6<374::AID-SIA535>3.0.CO;2-S     Document Type: Article

References (8)

1. Q. Zhong, D. Inniss and V. B. Elings, Surf. Sci. 290, L688 (1993).
2. G. Binnig, C. F. Quate and C. Gerber, Phys. Rev. Lett. 56, 930 (1986).
3. D. Sarid, T. G. Russel, R. K. Workman and D. Chen, J. Vac. Sci. Technol. B 14, 864 (1996).
4. D. Kruger, B. Anczykowski and H. Fuchs, Ann. Phys. 6, 341 (1997).
5. N. A. Burnham, O. P. Behrend, F. Oulevey, G. Gremaud, P.-J. Gallo, D. Gourdon, E. Dupas, A. J. Kulik, H. M. Pollock and G. A. D. Briggs, Nanotechnology 8, 67 (1997).
6. C. C. Blake and R. W. Small, Acta Cryst. B 29, 2201 (1972).
7. S. Manne, J. P. Cleveland, G. D. Stucky and P. K. Hansma, J. Cryst. Growth 130, 333 (1993).
8. Landolt-Bornstein, in Zahlenwerte und Funktionen, 2nd Edn, Vol. 5. Springer-Verlag, Berlin (1968).