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Volumn 81, Issue 2, 2000, Pages 35-40
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Topographic and phase-contrast imaging in atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL MICROSTRUCTURE;
DIELECTRIC FILMS;
GRAIN BOUNDARIES;
LEAD COMPOUNDS;
PLATINUM;
SILICA;
SILICON;
SURFACE ROUGHNESS;
TITANIUM;
TWINNING;
PHASE CONTRAST IMAGING;
ATOMIC FORCE MICROSCOPY;
PLATINUM;
SILICON;
SILICON DIOXIDE;
TITANIUM;
ANALYTIC METHOD;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMICAL STRUCTURE;
CRYSTAL;
IMAGING;
PHASE CONTRAST MICROSCOPY;
SURFACE PROPERTY;
TOPOGRAPHY;
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EID: 0034160051
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(99)00164-3 Document Type: Article |
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Times cited : (93)
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References (5)
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