Surface Roughness by Contact versus Tapping Mode Atomic Force Microscopy

Langmuir

Volumn 15, Issue 4, 1999, Pages 1429-1434

  Simpson, Garth J ^a   Sedin, Dana L ^a   Rowlen, Kathy L ^a  

^a UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CORRELATION METHODS; IMAGING TECHNIQUES; MICA; QUARTZ;

CONTACT MODE IMAGES; TAPPING MODE IMAGES; VARIANCE CORRELATION FUNCTIONS;

SURFACE ROUGHNESS;

EID: 0033077578     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la981024a     Document Type: Article

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