Electrochemistry of conductive polymers. 33. Electrical and optical properties of electrochemically deposited poly(3-methylthiophene) films employing current-sensing atomic force microscopy and reflectance spectroscopy

Journal of Physical Chemistry B

Volumn 108, Issue 42, 2004, Pages 16365-16371

  Lee, Hyo Joong ^a   Park, Su Moon ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE COUPLED DEVICES; DOPING (ADDITIVES); ELECTROCHEMISTRY; FIELD EFFECT TRANSISTORS; LIGHT EMITTING DIODES; LITHOGRAPHY; NANOSTRUCTURED MATERIALS;

CURRENT-SENSING ATOMIC FORCE MICROSCOPIC (CS-AFM); DERIVATIZATION; ELECTRONIC STATES; REFLECTANCE SPECTROSCOPY;

ORGANIC POLYMERS;

EID: 7644238714     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0472764     Document Type: Article

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