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Volumn 82, Issue 24, 2003, Pages 4358-4360

Schottky nanocontacts on ZnO nanorod arrays

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC BREAKDOWN; EVAPORATION; HETEROJUNCTIONS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SCHOTTKY BARRIER DIODES;

EID: 0038110784     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1584089     Document Type: Article
Times cited : (392)

References (22)
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    • Y. Cui and C. M. Lieber, Science 291, 851 (2001); J. F. Wang, M. S. Gudiksen, X. F. Duan, Y. Cui, and C. M. Lieber, Ibid. 293, 1455 (2001); Y. Cui, Q. Q. Wei, H. K. Park, and C. M. Lieber, ibid. 293, 1289 (2001); X. Duan, Y. Huang, Y. Cui, J. Wang, and C. M. Lieber, Nature (London) 409, 66 (2001).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.