Electrical resistivity of polypyrrole nanotube measured by conductive scanning probe microscope: The role of contact force

Applied Physics Letters

Volumn 81, Issue 24, 2002, Pages 4625-4627

  Park, J G ^a   Lee, S H ^a   Kim, B ^a   Park, Y W ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; POLYMERIC MEMBRANES; POLYPYRROLES; SYNTHESIS (CHEMICAL);

POLYCARBONATE MEMBRANES;

NANOTUBES;

EID: 0037049578     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1528281     Document Type: Article

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