Direct measurement of the microscale conductivity of conjugated polymer monolayers

Advanced Materials

Volumn 12, Issue 13, 2000, Pages 947-949

  Bøggild, Peter ^a   Grey, Francois ^a   Hassenkam, Tue ^b   Greve, Daniel R ^b   Bjørnholm, Thomas ^b  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b UNIVERSITY OF COPENHAGEN   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; CHARGE CARRIERS; DEPOSITION; ELECTRIC CONDUCTIVITY MEASUREMENT; MOLECULAR STRUCTURE; MONOLAYERS; MORPHOLOGY; STRUCTURE (COMPOSITION); SURFACE PHENOMENA; SYNTHESIS (CHEMICAL); THIN FILMS;

CONJUGATED POLYMER MONOLAYER; IN-PLANE CONDUCTIVITY; LANGMUIR-BLODGETT DEPOSITION; SURFACE CONDUCTIVITY;

POLYACETYLENES;

EID: 0034225737     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4095(200006)12:13<947::AID-ADMA947>3.0.CO;2-7     Document Type: Article

References (17)

1. J. Tsukamoto, Adv. Phys. 1992, 41, 509.
2. Handbook of Conducting Polymers (Eds: T. A. Skotheim, R. L. Elsenbaumer. J. R. Reynolds), Marcel Dekker, New York 1998.
3. J. H. Burroughes, D. D. C. Bradley, A. R. Brown, R. N. Marks, K. Mackay, R. H. Friend, P. L. Burns, A. B. Holmes, Nature 1990, 347, 539.
4. C. Drury, C. M. J. Mutsaers, C. M. Hart, M. Matters, D. M. D. de Leeuw, Appl. Phys. Lett. 1998, 73, 108.
5. N. Tessler, G. J. Denton, R. H. Friend, Nature 1996, 382, 695.
6. R. S. Kohlmann, A. J. Epstein, in Handbook of Conducting Polymers (Eds: T. A. Skotheim, R. L. Elsenbaumer, J. R. Reynolds). Marcel Dekker, New York 1998.
7. F. M. Smits, Bell Syst. Tech. J. 1958, May, p. 17
8. C. L. Petersen, F. Grey, M. Aono, Surf. Sci. 1997, 377-379, 676.
9. P. L. McEuen, N. G. Chopra, A. Zettl, A. Thess, R. E. Smalley, Science 1997, 275, 1922.
10. J. Loiacono, E. L. Granstrom, C. D. Frisbie. J. Phys. Chem. B 1998, 102, 1679. T. W. Kelley. E. L. Granstrom, C. D. Frisbie, Adv. Mater. 1999, 11, 261.
11. J. Loiacono, E. L. Granstrom, C. D. Frisbie. J. Phys. Chem. B 1998, 102, 1679. T. W. Kelley. E. L. Granstrom, C. D. Frisbie, Adv. Mater. 1999, 11, 261.
12. F. Houze, R. Meyer, O. Schneegans, L. Boyer, Appl. Phys. Lett. 1996, 69, 1975.
13. P. Bøggild, T. M. Hansen, C. L. Petersen, F. Grey, T. Hassenkam, T. Bjørnholm, I. Shiraki, S. Hasegawa in Precision Science and Technology for Perfect Surfaces (Eds: Y. Furukawa, Y. Mori, T. Kataoka) Japan Society for Precision Engineering (JSPE), Tokyo 1999, p. 832.
14. T. Bjørnholm, D. R. Greve, N. Reitzel, T. Hassenkam, K. Kjaer, P. B. Howes, N. B. Larsen, J. Bogelund, M. Jayaraman, P. C. Ewbank, R. D. McCulbugh, J. Am. Chem. Soc. 1998, 120, 7643. D. R. Greve, N. Reitzel, T. Hassenkam, J. Bogelund, K. Kjaer, P. B. Howes, N. B. Larsen, M. Jayaraman, R. D. McCullough, T. Bjørnholm, Synthetic Metals 1999, 102, 1502.
15. T. Bjørnholm, D. R. Greve, N. Reitzel, T. Hassenkam, K. Kjaer, P. B. Howes, N. B. Larsen, J. Bogelund, M. Jayaraman, P. C. Ewbank, R. D. McCulbugh, J. Am. Chem. Soc. 1998, 120, 7643. D. R. Greve, N. Reitzel, T. Hassenkam, J. Bogelund, K. Kjaer, P. B. Howes, N. B. Larsen, M. Jayaraman, R. D. McCullough, T. Bjørnholm, Synthetic Metals 1999, 102, 1502.
16. S. Y. Hong, D. S. Marynick, J. Chem. Phys. 1992, 96, 5497.
17. M. S. A. Abdou, S. Holdcroft, Synth. Met. 1993, 60, 93.