Probing electrical properties of oriented DNA by conducting atomic force microscopy

Nanotechnology

Volumn 12, Issue 3, 2001, Pages 211-216

  Cai, Lintao ^a,b   Tabata, Hitoshi ^a   Kawai, Tomoji ^a  

^a OSAKA UNIVERSITY   (Japan)

^b RICE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC POLYMERS; ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; EVAPORATION; MAGNESIUM PRINTING PLATES; MOLECULAR ORIENTATION; MOLECULES; POSITIVE IONS; SURFACE PHENOMENA;

AMINOPROPYLTRIETHANOXYSILANE; FREE FLOWING METHOD; MOLECULAR WIRE; MOLECULE ARRAY DENSITY; POLYSILINE; SHADOW MASK EVAPORATION; SPIN STRETCHING METHOD;

DNA;

EID: 0035443820     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/12/3/304     Document Type: Conference Paper

References (35)

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