Lateral force calibration: Accurate procedures for colloidal probe friction measurements in atomic force microscopy

Langmuir

Volumn 26, Issue 2, 2010, Pages 1386-1394

  Chung, Koo Hyun ^a   Pratt, Jon R ^a   Reitsma, Mark G ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; COLLOIDAL PROBE TECHNIQUES; COLLOIDAL PROBES; DIRECT METHOD; FORCE METHOD; FRICTION MEASUREMENTS; IN-PLANE; IN-SITU; INSTITUTE OF STANDARDS AND TECHNOLOGIES; LATERAL FORCE; LATERAL FORCE CALIBRATION; PIEZO-RESISTIVE; QUANTITATIVE ACCURACY; QUANTITATIVE MEASUREMENT; RANDOM UNCERTAINTIES; SECOND PROCEDURES; SELECTION CRITERIA; SURFACE FORCES; SYSTEMATIC UNCERTAINTIES;

ATOMS; CALIBRATION; FORCE MEASUREMENT; FRICTION; NANOCANTILEVERS; PROBES; TRIBOLOGY; UNCERTAINTY ANALYSIS;

ATOMIC FORCE MICROSCOPY;

EID: 74249107645     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la902488r     Document Type: Article

References (43)

1. Ducker, W. A.; Senden, T. J.; Pashley, R. M. Nature1991, 353, 239.
2. Kappl, M.,; Butt, H. J. Part. Syst. Charact. 2002, 19(3), 129.
3. Cain, R. G.; Page, N. W.; Biggs, S. Phys. Rev. E 2000, 62(6), 8369.
4. Berg, I. C. H.; Rutland, M. W.; Arnebrant, T. Biofouling 2003, 19(6), 365.
5. Varenberg, M.; Etsion, L; Halperin, G. Tripol. Lett. 2005, 18(4), 493.
6. Feiler, A. A.; Jenkins, P.; Rutland, M. W.J. Adhes. Sci. Technol. 2005,19 (3-5), 165.
7. Pettersson, T.; Naderi, A.; Makuska, R.; Claesson, P. M. Langmuir 2008, 24 (7), 3336.
8. Cardenas, M.; Valle-Delgado, J. J.; Hamit, J.; Rutland, M. W.; Arnebrant, T. Langmuir 2008, 24(14), 7262.
9. Ralston, J.; Larson, I.; Rutland, M. W.; Feiler, A. A.; Kleijn, M. Pure Appl. chem. 2005, 77(12), 2149.
10. Butt, H.-J.; Cappella, B.; Kappl, M. surf. Sci. Rep. 2005, 59, 1.
11. Since an. AFM cantilever is usually mounted at a small angle relative to a nominal planar surface, a geometrical correction is required to resolve force in the z-direction. For example, see ref 12.
12. Edwards, S. A.; Ducker, W. A.; Sader, J. E. Appl. Phys. 2008, 103, 064513.
13. Cleveland, J. P.; Manne, S.; Bocek, D.; Hansma, P. K. Rev. Sci. Instrum. 1993, 64(2), 403.
14. Green, C. P.; Lioe, H.; Cleveland, J. P.; Proksch, R.; Mulvaney, P.; Sader, J. E. Rev. Set Instrum. 2004, 75(6), 1988.
15. Burnham, N. A.; Chen, X.; Hodges, C. S.; Matei, G. A.; Thoreson, E. J.; Roberts, C. J.; Davies, M. C.; Tendier, S. J. B. Nanotechnology 2003, 14(1), 1.
16. Ying, Z. C.; Reitsma, M. G.; Gates, R. S. Rev. Sci. Instrum. 2007, 78, 063708.
17. Gates, R. S.; Reitsma, M. G. Rev. Sci. Instrum. 2007, 78, 086101.
18. Gates, R. S.; Pratt, J. R. Meas. sci., Technol. 2006, 17, 2852.
19. Chung, K.-H.; Shaw, GTT; Pratt, J. R. Rev. Sci. Instrum. 2009, 80(6), 065107.
20. Toikka, G.; Hayes, R. A.; Ralston, J. J.Adhes. Sci Technol. 1997, 11(12), 1479.
21. Feiler, A.; Attard, P.; Larson, I. Rev. Sci. Instrum. 2000, 71(7), 2746.
22. Reitsma, M. G. Rev. Sci. Instrum. 2007, 78, 106102.
23. Ogletree, D. F.; Carpick, R. W.; Salmeron, M. Rev. Sci. Instrum, 1996, 67 (9), 3298.
24. Varenberg, M.; Etison, I.; Halperin, G. Rev. Sci. Instrum. 2003, 74(7), 3362.
25. Li, Q.; Kim, K.-S,; Rydberg, A. Rev. Sci. Instrum. 2006, 77, 065105.
26. Ecke, S.; Raiteri, R.; Bonaccurso, E.; Reiner, C.; Deiseroth, H.-J.; Butt, H.-J. Rev. Sci Instrum. 2001, 72(11), 4164.
27. Cannara, R. J.; Eglin, M.; Carpick, R. W. Rev. Sci Instrum, 2006, 77, 053701.
28. Cain, R. G.; Biggs, S.; Page, N. W. J. Colloid Interface Sci 2000, 227, 55.
29. 14 may be applicable to colloidal probes, although the method was not used here.
30. Rabinovich, Y. I.; Yoon, R.-H. Langmuir 1994, 10, 1903.
31. Torii, A.; Sasaki, M.; Hane, K.; Shigeru, O. Meas. Sci Technol., 1996, 7, 179.
32. Gibson, C. T.; Watson, G. S.; Myhra, S. Nanotechnology 1996, 7, 259.
33. Tortonese, M.; Kirk, M. D. proc. SPIE-Int. Soc. Opt. Eng. 1997, 3009, 53.
34. Langlois, E. D.; Shaw, G. A.; Kramar, J. A.; Pratt, J. R.; Hurley, D. C. Rev. Sci Instrum, 2007, 78, 093705.
35. Xie, H.; Vitard, J.; Haliyo, S.; Régnier, S.; Boukallel, M. rev. Sci. Instrum. 2008, 79, 033708.
36. Certain commercial equipment, instruments, or materials are identified in this article to adequately specify the experimental procedure. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified is necessarily the best available for the purpose.
37. The torsional axis of the cantilever is assumed to be aligned down the long (x) axis and centered through, the thickness and width of the cantilever. It is acknowledged that this assumption may not be strictly correct for all loading conditions, as pointed out in ref 25.
38. Sader, J. E.; Green, C. P. Rev. Sci. Instrum. 2004, 75(4), 878.
39. Carpick, R. W.; Ogletree, D. F.; Salmeron, M., Appl. Phys. Lett. 1997, 70 (12), 1548.
40. Johnson, K. L. Contact Mechanics; Cambridge University Press: Cambridge, U.K., 1987.
41. Unless otherwise stated, all uncertainties represent one standard deviation.
42. Value includes uncertainty in the determination of A (which was ±250 nm).
43. Pratt, J. R.; Smith, D. T.; Newell, D. B.; Kramar, J. A.; Whitenton, E. J. Mater. Res. 2004, 19(1), 366.