Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array

Review of Scientific Instruments

Volumn 78, Issue 8, 2007, Pages

  Gates, Richard S ^a   Reitsma, Mark G ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; DATA REDUCTION; LINEAR REGRESSION; STIFFNESS;

EULER BERNOULLI MODELS; REFERENCE CANTILEVER ARRAYS; SPRING CONSTANTS;

MICROSCOPES;

ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; ELASTICITY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; MECHANICAL STRESS; REFERENCE VALUE; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; STANDARD; TRANSDUCER; UNITED STATES;

CALIBRATION; ELASTICITY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MICROSCOPY, ATOMIC FORCE; REFERENCE VALUES; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; STRESS, MECHANICAL; TRANSDUCERS; UNITED STATES;

EID: 34548420670     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2764372     Document Type: Article

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