Spring constant calibration of atomic force microscopy cantilevers with a piezosensor transfer standard

Review of Scientific Instruments

Volumn 78, Issue 9, 2007, Pages

  Langlois, E D ^a,b,c   Shaw, G A ^a   Kramar, J A ^a   Pratt, J R ^a   Hurley, D C ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UCB 450   (United States)

^c ANALOG DEVICES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; PIEZOELECTRIC DEVICES; SINGLE CRYSTALS; SPRINGS (COMPONENTS);

ATOMIC FORCE MICROSCOPY CANTILEVERS; PIEZOSENSOR TRANSFER STANDARD;

CANTILEVER BEAMS;

EID: 34948851837     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2785413     Document Type: Article

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