Accurate noncontact calibration of colloidal probe sensitivities in atomic force microscopy

Review of Scientific Instruments

Volumn 80, Issue 6, 2009, Pages

  Chung, Koo Hyun ^a   Shaw, Gordon A ^a   Pratt, Jon R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSOLUTE ACCURACY; AFM; ATOMIC FORCE MICROSCOPES; COLLOIDAL PROBES; FORCE CALIBRATION; FORCE SENSITIVITY; NON-CONTACT; SPRING CONSTANTS; STANDARD UNCERTAINTY; THERMAL-NOISE SPECTRUM;

ATOMIC FORCE MICROSCOPY; ATOMS; CALIBRATION; ELECTROSTATICS; FORCE MEASUREMENT; ONTOLOGY; THERMAL NOISE; UNCERTAINTY ANALYSIS;

PROBES;

MICROSPHERE; WATER;

AIR; ALGORITHM; ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; COLLOID; ELASTICITY; FRICTION; METHODOLOGY; MICROELECTRODE; STATIC ELECTRICITY; STATISTICAL MODEL; TEMPERATURE; THEORETICAL MODEL;

AIR; ALGORITHMS; CALIBRATION; COLLOIDS; ELASTICITY; FRICTION; LINEAR MODELS; MICROELECTRODES; MICROSCOPY, ATOMIC FORCE; MICROSPHERES; MODELS, THEORETICAL; STATIC ELECTRICITY; TEMPERATURE; WATER;

EID: 67650333634     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3152335     Document Type: Article

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