|
Volumn 75, Issue 4, 2004, Pages 878-883
|
In-plane deformation of cantilever plates with applications to lateral force microscopy
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ASPECT RATIO;
ATOMIC FORCE MICROSCOPY;
CALCULATIONS;
DEFORMATION;
FORCE MEASUREMENT;
IMAGING TECHNIQUES;
CANTILEVER PLATES;
IN PLANE DEFORMATION;
IN PLANE SPRING CONSTANTS;
LATERAL FORCE MICROSCOPY;
MICROSCOPES;
|
EID: 2042543448
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1667252 Document Type: Article |
Times cited : (50)
|
References (19)
|