-
2
-
-
51349108334
-
A novel method for packaging of micromechined piezoresistive pressure sensor
-
Orlando, FL, USA, May
-
Abbaspour-Santi, E.; Afrang, S.; Teymoori, M.M. A novel method for packaging of micromechined piezoresistive pressure sensor. In Proceedings of the IEEE the International Conference on Software Engineering, Orlando, FL, USA, May 2002; pp. 141-144.
-
(2002)
Proceedings of the IEEE the International Conference on Software Engineering
, pp. 141-144
-
-
Abbaspour-Santi, E.1
Afrang, S.2
Teymoori, M.M.3
-
3
-
-
0030380733
-
Analytical techniques for examining reliability and failure mechanism of barrier coating encapsulated silicon pressure sensor exposed to harsh media
-
Austin, TX, USA, August
-
Bitko, G.; Monk, D.J.; Maudie, T.; Stanerson, D.; Wertz, J.; Matkin, J.; Petrovic, S. Analytical techniques for examining reliability and failure mechanism of barrier coating encapsulated silicon pressure sensor exposed to harsh media. In Proceedings of the SPIE, Austin, TX, USA, August 1996; pp. 248-258.
-
(1996)
Proceedings of the SPIE
, pp. 248-258
-
-
Bitko, G.1
Monk, D.J.2
Maudie, T.3
Stanerson, D.4
Wertz, J.5
Matkin, J.6
Petrovic, S.7
-
4
-
-
0032092118
-
Measurement of package-induced stress and thermal zero shift in transfer molded silicon piezoresistive pressure sensors
-
Nyather, J.B.; Larsen, A.; Liverod, B.; Ohlckers, P. Measurement of package-induced stress and thermal zero shift in transfer molded silicon piezoresistive pressure sensors. J. Micromech. Microeng. 1998, 8, 168-171.
-
(1998)
J. Micromech. Microeng
, vol.8
, pp. 168-171
-
-
Nyather, J.B.1
Larsen, A.2
Liverod, B.3
Ohlckers, P.4
-
5
-
-
84944744452
-
Two-chip pressure sensor and single conditioning
-
Boston, USA, June
-
Dancaster, J.; Kim, W.; Do, D. Two-chip pressure sensor and single conditioning. In Proceedings of the 12th International Conference on Solid-State Sensors, Actuators and Microsystems, Boston, USA, June 2003; pp. 1699-1702.
-
(2003)
Proceedings of the 12th International Conference on Solid-State Sensors, Actuators and Microsystems
, pp. 1699-1702
-
-
Dancaster, J.1
Kim, W.2
Do, D.3
-
6
-
-
6344294154
-
Finite element simulation of packaging stress in transfer molded MEMS pressure sensors
-
Krondorfer, R.; Kim, Y.K.; Kim, J.; Gustafson, J.K.; Lommasson, T.C. Finite element simulation of packaging stress in transfer molded MEMS pressure sensors. Microelectron. Reliab. 2004, 44, 1995-2002.
-
(2004)
Microelectron. Reliab.
, vol.44
, pp. 1995-2002
-
-
Krondorfer, R.1
Kim, Y.K.2
Kim, J.3
Gustafson, J.K.4
Lommasson, T.C.5
-
7
-
-
33745725851
-
Packaging of silicon pressure sensors for home application
-
Hong-Kong, China, December
-
Campabadal, F.; Cmeras, L.; Arrieta, M.J. Packaging of silicon pressure sensors for home application. In Proceedings of the IEEE Conference on Electron Devices and Solid-State Circuits, Hong-Kong, China, December 2005; pp. 589-591.
-
(2005)
Proceedings of the IEEE Conference on Electron Devices and Solid-State Circuits
, pp. 589-591
-
-
Campabadal, F.1
Cmeras, L.2
Arrieta, M.J.3
-
9
-
-
0042284296
-
Low-cost plastic sensor packaging using the open-window packaging concept
-
Cotofana, C.; Bossche, A.; Kaldenberg, P.; Mollinger, J. Low-cost plastic sensor packaging using the open-window packaging concept. Sens. Actuat. A: Phys. 1998, 67, 185-190.
-
(1998)
Sens. Actuat. A: Phys.
, vol.67
, pp. 185-190
-
-
Cotofana, C.1
Bossche, A.2
Kaldenberg, P.3
Mollinger, J.4
-
10
-
-
0037674935
-
Development of transfer molding technology for package with die active side partially exposed
-
New Orleans, LA, USA, May
-
Tseng, H.K.E; Zong, Z.B.; Lee, S.G.; Ho, S.C.; Srikanth, N. Development of transfer molding technology for package with die active side partially exposed. In Proceedings of the 53th Electronic Components and Technology Conference, New Orleans, LA, USA, May 2003; pp. 365-372.
-
(2003)
Proceedings of the 53th Electronic Components and Technology Conference
, pp. 365-372
-
-
Tseng, H.K.E.1
Zong, Z.B.2
Lee, S.G.3
Ho, S.C.4
Srikanth, N.5
-
11
-
-
48649108609
-
A novel packaging process for open-channel sensors
-
Taipei, Taiwan, October
-
Hsu, C.Y.; Chen, L.T.; Chang, J.S.; Chu, C.H. A novel packaging process for open-channel sensors. In Proceedings of the International Microsystems, Packagings, Assembly and Circuits Technology Conference, Taipei, Taiwan, October 2007; pp. 258-261.
-
(2007)
Proceedings of the International Microsystems, Packagings, Assembly and Circuits Technology Conference
, pp. 258-261
-
-
Hsu, C.Y.1
Chen, L.T.2
Chang, J.S.3
Chu, C.H.4
-
12
-
-
51349131106
-
A tiny plastic package of piezoresistive pressure sensors constructed by sacrifice-replacement approach
-
Lake Buena Vista, FL, USA, May
-
Chen, L.T.; Hsu, C.Y.; Chang, J.S.; Shieh, W.L.; Xie, Y.Z.; Chu, C.H. A tiny plastic package of piezoresistive pressure sensors constructed by sacrifice-replacement approach. In Proceedings of the 58th Electronic Components and Technology Conference, Lake Buena Vista, FL, USA, May 2008; pp. 1849-1854.
-
(2008)
Proceedings of the 58th Electronic Components and Technology Conference
, pp. 1849-1854
-
-
Chen, L.T.1
Hsu, C.Y.2
Chang, J.S.3
Shieh, W.L.4
Xie, Y.Z.5
Chu, C.H.6
-
13
-
-
58149182733
-
A novel plastic package for pressure sensors fabricated using the lithographic dam-ring approach
-
Chen, L.T.; Cheng, W.H. A novel plastic package for pressure sensors fabricated using the lithographic dam-ring approach. Sens. Actuat. A: Phys. 2009, 149, 165-171.
-
(2009)
Sens. Actuat. A: Phys.
, vol.149
, pp. 165-171
-
-
Chen, L.T.1
Cheng, W.H.2
-
14
-
-
33846693940
-
Piezoresistance effect in germanium and silicon
-
Smith, C.S. Piezoresistance effect in germanium and silicon. Phys. Rev. 1954, 94, 42-49.
-
(1954)
Phys. Rev.
, vol.94
, pp. 42-49
-
-
Smith, C.S.1
-
15
-
-
0033138345
-
High aspect ratio UV photography for electroplated structure
-
Roth, S.; Dellmann, L.; Racine, G.A.; Rooij, N.F. High aspect ratio UV photography for electroplated structure. J. Micromech. Microeng. 1999, 9, 105-108.
-
(1999)
J. Micromech. Microeng
, vol.9
, pp. 105-108
-
-
Roth, S.1
Dellmann, L.2
Racine, G.A.3
Rooij, N.F.4
-
16
-
-
0036646203
-
Thick photoresist development for the fabrication of high aspect ratio magnetic coils
-
Brunet, M.; O'Donnell, T.; O'Brien, J.; McCloskey, P.; Mathuna, S.C.Ó. Thick photoresist development for the fabrication of high aspect ratio magnetic coils. J. Micromech. Microeng. 2002, 12, 444-449.
-
(2002)
J. Micromech. Microeng
, vol.12
, pp. 444-449
-
-
Brunet, M.1
O'Donnell, T.2
O'Brien, J.3
McCloskey, P.4
Mathuna, S.C.Ó.5
-
17
-
-
0038487752
-
Reliability of electroplating mold with thick positive spr 220-7 photoresist
-
Kukharenka, E.; Kraft, M. Reliability of electroplating mold with thick positive spr 220-7 photoresist. J. Mater. Sci. Mater. Electron. 2003, 14, 319-322.
-
(2003)
J. Mater. Sci. Mater. Electron
, vol.14
, pp. 319-322
-
-
Kukharenka, E.1
Kraft, M.2
-
18
-
-
20344363047
-
High-aspect-ratio ultrathick negative-tone near-UV photoresist and its applications for MEMS
-
Despont, M.; Lorenz, H.; Fahrni, N.; Brugger, J.; Renaud, P.; Vettiger, P. High-aspect-ratio ultrathick negative-tone near-UV photoresist and its applications for MEMS. J. Micromech. Microeng. 1997, 7, 121-124.
-
(1997)
J. Micromech. Microeng
, vol.7
, pp. 121-124
-
-
Despont, M.1
Lorenz, H.2
Fahrni, N.3
Brugger, J.4
Renaud, P.5
Vettiger, P.6
-
19
-
-
0036544396
-
High aspect ratio ultra-thick micro-stencil by JSR THB-430N negative tone UV photoresist
-
Tseng, F.G.; Yu, C.S. High aspect ratio ultra-thick micro-stencil by JSR THB-430N negative tone UV photoresist. Sens. Actuat. A: Phys. 2002, 97-98, 764-770.
-
(2002)
Sens. Actuat. A: Phys.
, vol.97-98
, pp. 764-770
-
-
Tseng, F.G.1
Yu, C.S.2
-
20
-
-
0038798179
-
Micromachining applications of a high resolution ultratick photoresis
-
Lee, K.Y.; LaBianca, N.; Rishton, S.A.; Zolgharnain, S.; Gelorme, J.D.; Shaw, J.; Chang, T.H.-P. Micromachining applications of a high resolution ultratick photoresis. J. Vac. Sci. Technol. B. 1995, 13, 3012-3016.
-
(1995)
J. Vac. Sci. Technol. B
, vol.13
, pp. 3012-3016
-
-
Lee, K.Y.1
Labianca, N.2
Rishton, S.A.3
Zolgharnain, S.4
Gelorme, J.D.5
Shaw, J.6
Chang, T.H.-P.7
-
21
-
-
0000968175
-
Fabrication of photoplastic high-aspect ratio micro-parts and micro-molds using SU-8 UV resist
-
Lorenz, H.; Despont, M.; Vettiger, P.; Renaud, P. Fabrication of photoplastic high-aspect ratio micro-parts and micro-molds using SU-8 UV resist. Microsyst. Technol. 1998, 4, 143-146.
-
(1998)
Microsyst. Technol.
, vol.4
, pp. 143-146
-
-
Lorenz, H.1
Despont, M.2
Vettiger, P.3
Renaud, P.4
-
22
-
-
33748621485
-
The effect of epoxy molding compound on thermal/residual deformations and stress on IC packaging during manufacturing process
-
Tsai, M.Y.; Wang, C.T.; Hsu, C.H. The effect of epoxy molding compound on thermal/residual deformations and stress on IC packaging during manufacturing process. IEEE Trans. Compon. Packag. Technol. 2006, 29, 625-635.
-
(2006)
IEEE Trans. Compon. Packag. Technol
, vol.29
, pp. 625-635
-
-
Tsai, M.Y.1
Wang, C.T.2
Hsu, C.H.3
-
23
-
-
31044449217
-
Packaging effect investigation of CMOS compatible pressure sensors using flip chip and flex circuit board technologies
-
Lee, C.C.; Peng, C.T.; Chiang, K.N. Packaging effect investigation of CMOS compatible pressure sensors using flip chip and flex circuit board technologies. Sens. Actuat. A: Phys. 2006, 126, 48-55.
-
(2006)
Sens. Actuat. A: Phys.
, vol.126
, pp. 48-55
-
-
Lee, C.C.1
Peng, C.T.2
Chiang, K.N.3
-
24
-
-
17144393732
-
Performance and package effect of a novel piezoresistive pressure sensor fabricated by front-side etching technology
-
Peng, C.T.; Lin, J.C.; Lin, C.T.; Chiang, K.N. Performance and package effect of a novel piezoresistive pressure sensor fabricated by front-side etching technology. Sens. Actuat. A: Phys. 2005, 119, 28-37.
-
(2005)
Sens. Actuat. A: Phys.
, vol.119
, pp. 28-37
-
-
Peng, C.T.1
Lin, J.C.2
Lin, C.T.3
Chiang, K.N.4
-
26
-
-
34548126911
-
Analysis of the packaging stress in monolithic multi-sensor
-
Bangkok, Thailand, January
-
Xu, J.; Zhao, Y.; Jiang, Z. Analysis of the packaging stress in monolithic multi-sensor. In Proceedings of the 2nd IEEE International Conference on Nano/Micro Engineering and Molecular Systems, Bangkok, Thailand, January 2007; pp. 241-244.
-
(2007)
Proceedings of the 2nd IEEE International Conference on Nano/Micro Engineering and Molecular Systems
, pp. 241-244
-
-
Xu, J.1
Zhao, Y.2
Jiang, Z.3
-
27
-
-
0032092118
-
Measurement of package-induced stress and thermal zero shift in transfer molded silicon piezoresistive pressure sensors
-
Nysether, J.B.; Larsen, A.; Liverod, B.; Ohlckers, P. Measurement of package-induced stress and thermal zero shift in transfer molded silicon piezoresistive pressure sensors. J. Micromech. Microeng. 1998, 8, 168-171.
-
(1998)
J. Micromech. Microeng
, vol.8
, pp. 168-171
-
-
Nysether, J.B.1
Larsen, A.2
Liverod, B.3
Ohlckers, P.4
|