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Volumn , Issue , 2007, Pages 258-261

A novel packaging process for open-channel sensors

Author keywords

[No Author keywords available]

Indexed keywords

CHIP SCALE PACKAGES; CLADDING (COATING); ELECTRONIC EQUIPMENT MANUFACTURE; KETONES; LITHOGRAPHY; MICROELECTRONICS; MICROSYSTEMS; OPEN CHANNEL FLOW; PHOTORESISTS; SENSORS; TECHNOLOGY;

EID: 48649108609     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMPACT.2007.4433612     Document Type: Conference Paper
Times cited : (2)

References (7)
  • 4
    • 0030380733 scopus 로고    scopus 로고
    • Analytical techniques for examining reliability and failure mechanisms of barrier-coated encapsulated silicon pressure sensors exposed to harsh media
    • Austin, TX, USA
    • G. Bitko, D. J. Monk, T. Maudie, D. Stanerson, J. Wertz, J. Matkin, and S. Petrovic, "Analytical techniques for examining reliability and failure mechanisms of barrier-coated encapsulated silicon pressure sensors exposed to harsh media," in Micromachined Devices and Components II, Austin, TX, USA, 1996, pp. 248-258.
    • (1996) Micromachined Devices and Components II , pp. 248-258
    • Bitko, G.1    Monk, D.J.2    Maudie, T.3    Stanerson, D.4    Wertz, J.5    Matkin, J.6    Petrovic, S.7
  • 7
    • 48649096485 scopus 로고    scopus 로고
    • NANO™ SU-8, Negative Tone Photoresit Formulations 50-100, (Newton, MA : MicroChem Corporation) 262-265
    • NANO™ SU-8, "Negative Tone Photoresit Formulations 50-100," (Newton, MA : MicroChem Corporation) 262-265


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.