Dynamics of quartz tuning fork force sensors used in scanning probe microscopy

Nanotechnology

Volumn 20, Issue 21, 2009, Pages

  Castellanos Gomez, A ^a   Agrat, N ^a,b,c   Rubio Bollinger, G ^a,b  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b INSTITUTO NICOLÁS CABRERA   (Spain)

^c INSTITUTO MADRILEÑO DE ESTUDIOS AVANZADOS EN NANOCIENCIA IMDEA NANOCIENCIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SENSORS; DYNAMICS; HYDROPHOBICITY; OSCILLATORS (MECHANICAL); QUARTZ; THERMAL NOISE;

COUPLED HARMONIC OSCILLATORS; COUPLED OSCILLATORS; EXPERIMENTAL CHARACTERIZATION; PRECISE DETERMINATIONS; QUANTITATIVE RELATIONS; QUARTZ TUNING FORK; RESONANCE FREQUENCY SHIFT; SINGLE OSCILLATORS;

SCANNING PROBE MICROSCOPY;

SILICON DIOXIDE;

ACCURACY; ARTICLE; CALIBRATION; CONTROLLED STUDY; ELASTICITY; EXPERIMENTAL MODEL; EXPERIMENTAL STUDY; FORCE; OSCILLATOR; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SCANNING PROBE MICROSCOPY; SENSOR; TUNING FORK; VALIDATION PROCESS; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; MICROELECTROMECHANICAL SYSTEM; NANOTECHNOLOGY; THEORETICAL MODEL; TRANSDUCER;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MICRO-ELECTRICAL-MECHANICAL SYSTEMS; MICROSCOPY, SCANNING PROBE; MODELS, THEORETICAL; NANOTECHNOLOGY; TRANSDUCERS;

EID: 67649154133     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/21/215502     Document Type: Article

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