The tuning fork as sensor for dynamic force distance control in scanning near-field optical microscopy

Journal of Microscopy

Volumn 194, Issue 2-3, 1999, Pages 307-310

  Naber, A ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Near field optics; Quartz tuning fork; Tetrahedral tip; Tip sample distance control

Indexed keywords

OPTICAL DATA STORAGE;

DISTANCE CONTROL; DYNAMIC FORCES; NEAR FIELD OPTICS; PIEZOELECTRIC FORCE SENSORS; QUARTZ TUNING FORK; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; TETRAHEDRAL TIP; TIP-SAMPLE DISTANCE; TIP-SAMPLE DISTANCE CONTROL;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

SILICON DIOXIDE;

CONFERENCE PAPER; DYNAMICS; OSCILLATION; PIEZOELECTRICITY; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SENSOR;

EID: 0033050966     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00548.x     Document Type: Conference Paper

References (4)

1. Karraï, K. & Grober, R.D. (1995) Piezoelectric tip-sample distance control for near-field optical microscopes. Appl. Phys. Lett. 66, 1842-1844.
2. Koglin, J., Fischer, U.C. & Fuchs, H. (1947) Material contrast in scanning near-field optical microscopy at 1-10 nm resolution. Phys. Rev. B, 55, 7977-7984.
3. Martin, Y., Williams, C.C. & Wickramasinghe, H.K. (1987) Atomic force microscope-force mapping and profiling on a sub 100-Å scale. J. Appl. Phys. 61, 4723.
4. Ruiter, A.G.T., Veermnn, J.A., van der Werf, K.O. & van Hulst, N.F. (1997) Dynamic behavior of tuning fork shear-force feedback. Appl. Phys. Lett. 71, 28-30.