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Volumn 93, Issue 11, 2004, Pages

Metallic adhesion in atomic-size junctions

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ELECTRIC CONDUCTANCE; ELECTRIC CURRENTS; ELECTRODES; ELECTRON TRANSITIONS; GOLD; NANOTECHNOLOGY; SEMICONDUCTOR JUNCTIONS; SEPARATION; SOLDERING; VAN DER WAALS FORCES;

EID: 19644389612     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.93.116803     Document Type: Article
Times cited : (60)

References (29)
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    • U. Dürig et al., Phys. Rev. Lett. 65, 349 (1990); U. Dürig et al., Europhys. Lett. 23, 147 (1993).
    • (1990) Phys. Rev. Lett. , vol.65 , pp. 349
    • Dürig, U.1
  • 2
    • 3343009894 scopus 로고
    • U. Dürig et al., Phys. Rev. Lett. 65, 349 (1990); U. Dürig et al., Europhys. Lett. 23, 147 (1993).
    • (1993) Europhys. Lett. , vol.23 , pp. 147
    • Dürig, U.1
  • 15
    • 7044277303 scopus 로고    scopus 로고
    • note
    • The fact that the electrical parameters of a tuning fork barely change upon cooling down (apart from the quality factor) indicates that this calibration remains valid at low temperature.
  • 20
    • 0035970899 scopus 로고    scopus 로고
    • M. A. Lantz et al., Science 291, 2580 (2001).
    • (2001) Science , vol.291 , pp. 2580
    • Lantz, M.A.1
  • 27
    • 0000791128 scopus 로고
    • U. Landman et al., Science 248, 454 (1990).
    • (1990) Science , vol.248 , pp. 454
    • Landman, U.1
  • 28
    • 85088491235 scopus 로고    scopus 로고
    • note
    • 0.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.