Combined scanning force microscopy and scanning tunneling spectroscopy of an electronic nanocircuit at very low temperature

Applied Physics Letters

Volumn 90, Issue 4, 2007, Pages

  Senzier, J ^a   Luo, P S ^a   Courtois, H ^a,b  

^a CNRS   (France)

^b INSTITUT UNIVERSITAIRE DE FRANCE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH TUNNEL JUNCTIONS; LOCAL PROBE MICROSCOPES; SCANNING FORCE MICROSCOPY; SUPERCONDUCTING NANOCIRCUITS;

ELECTRON TUNNELING; LOW TEMPERATURE EFFECTS; NETWORKS (CIRCUITS); SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR JUNCTIONS; SUBSTRATES;

NANOTECHNOLOGY;

EID: 33846648051     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2436651     Document Type: Article

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