Force-distance studies with piezoelectric tuning forks below 4.2 K

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 290-294

  Rychen, J ^a   Ihn, T ^a   Studerus, P ^a   Herrmann, A ^a   Ensslin, K ^a   Hug, H J ^b   Van Schendel, P J A ^b   Guntherodt H J ^b  

^a ETH ZURICH   (Switzerland)

^b UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; ELECTROSTATICS; ETCHING; FREQUENCY MODULATION; GRAPHITE; OSCILLATIONS; SENSORS; TUNGSTEN; TUNING;

DYNAMIC FORCE MICROSCOPY; FREQUENCY MODULATION FORCE MICROSCOPY; KELVIN FORCE MICROSCOPY;

PIEZOELECTRIC TRANSDUCERS;

EID: 0033742198     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00541-3     Document Type: Article

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