메뉴 건너뛰기




Volumn 86, Issue 4-6, 2009, Pages 971-975

Development of a titanium plasma etch process for uncooled titanium nanobolometer fabrication

Author keywords

Bolometer; EBL; MEMS; Nanobolometer; Plasma etch; Titanium

Indexed keywords

EBL; ETCH PROCESS; FRACTIONAL FACTORIAL EXPERIMENTS; INFRARED SENSORS; IR SENSORS; MAIN EFFECTS; METAL PLASMAS; NANO-SCALE; NANOBOLOMETER; NANOSCALE ETCH; PLASMA ETCH; PROCESS PARAMETERS; TARGET LEVELS; TITANIUM PLASMAS; UNCOOLED;

EID: 67349139189     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2009.02.009     Document Type: Article
Times cited : (3)

References (21)
  • 1
    • 53349156304 scopus 로고    scopus 로고
    • Fabrication and integration of nanobolometer sensors on a MEMs process
    • Nano Science and Technology Institute, Cambridge, United States
    • S.F. Gilmartin et al., Fabrication and integration of nanobolometer sensors on a MEMs process, in: Proceedings of the 2008 NSTI Nanotechnology Conference, Nano Science and Technology Institute, Cambridge, United States, 2008, pp. 596-599.
    • (2008) Proceedings of the 2008 NSTI Nanotechnology Conference , pp. 596-599
    • Gilmartin, S.F.1
  • 2
    • 55449096889 scopus 로고    scopus 로고
    • Uncooled IR nanobolometers fabricated by electron beam lithography and a MEMS/CMOS process
    • S.F. Gilmartin et al., Uncooled IR nanobolometers fabricated by electron beam lithography and a MEMS/CMOS process, in: Proceedings of the NANO '08. 8th IEEE Conference on Nanotechnology, 2008, pp. 131-134.
    • (2008) Proceedings of the NANO '08. 8th IEEE Conference on Nanotechnology , pp. 131-134
    • Gilmartin, S.F.1
  • 5
    • 33747630456 scopus 로고    scopus 로고
    • High Sensitivity 640 × 512 (20 micron pitch) microbolometer FPAs
    • D.F. Murphy et al., High Sensitivity 640 × 512 (20 micron pitch) microbolometer FPAs, SPIE, 2006, p. 62061A.
    • (2006) SPIE
    • Murphy, D.F.1
  • 8
    • 0010697883 scopus 로고    scopus 로고
    • Fabrication Process for 256 × 256 Bolometer-type Uncooled Infrared Detector
    • H. Wada et al., Fabrication Process for 256 × 256 Bolometer-type Uncooled Infrared Detector, SPIE, 1997, pp. 40-51.
    • (1997) SPIE , pp. 40-51
    • Wada, H.1
  • 11
    • 45549109773 scopus 로고    scopus 로고
    • Amorphous Silicon Based Large Format Uncooled FPA Microbolometer Technology
    • T. Schimert et al., Amorphous Silicon Based Large Format Uncooled FPA Microbolometer Technology, SPIE, 2008, p. 694023.
    • (2008) SPIE , pp. 694023
    • Schimert, T.1
  • 20
    • 0032689075 scopus 로고    scopus 로고
    • Low-cost 320 × 240 uncooled IRFPA using a conventional silicon IC process
    • SPIE
    • T. Ishikawa et al., Low-cost 320 × 240 uncooled IRFPA using a conventional silicon IC process, in: Proceedings of the Infrared Technology and Applications XXV, SPIE, 1999, pp. 556-564.
    • (1999) Proceedings of the Infrared Technology and Applications , vol.25 , pp. 556-564
    • Ishikawa, T.1
  • 21
    • 0030413050 scopus 로고    scopus 로고
    • S.C. Abraham, New chemistry for a high-density plasma etcher that improves etch rate loading on the TiN ARC layer when geometries are below 0.5 micron, IEEE, Piscataway, NJ, USA, 1996, pp. 328-332.
    • S.C. Abraham, New chemistry for a high-density plasma etcher that improves etch rate loading on the TiN ARC layer when geometries are below 0.5 micron, IEEE, Piscataway, NJ, USA, 1996, pp. 328-332.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.