High sensitivity 640 × 512 (20 μm Pitch) microbolometer FPAs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6206 I, Issue , 2006, Pages

  Murphy, D ^a   Ray, M ^a   Kennedy, A ^a   Wyles, J ^a   Hewitt, C ^a   Wyles, R ^a   Gordon, E ^a   Sessler, T ^a   Baur, S ^a   Van Lue, D ^a   Anderson, S ^a   Chin, R ^a   Gonzalez, H ^a   Le Pere, C ^a   Ton, S ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROBOLOMETERS; SENSOR ELECTRONICS; SERIAL INTERFACE; SYSTEM RESOLUTION;

BANDWIDTH; ELECTRIC POWER UTILIZATION; IMAGE SENSORS; INTEGRATED CIRCUITS; OPTICAL DEVICES; SPURIOUS SIGNAL NOISE;

BOLOMETERS;

EID: 33747630456     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.674018     Document Type: Conference Paper

References (12)

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8. D. Murphy, R. Wyles, J. Wyles, M. Ray, A. Kennedy, W. Radford, J. Asbrock, N. Lum, C. Hewitt, D. Graham, J.Anderson, R. Chin, D. Bradley, T.Kostrzewa, "High Sensitivity (25 μm Pitch) Microbolometer FPAs and Applications Development", Proceedings of SPIE, Vol. 4369, pp. 222-234, April 2001.
9. D. Murphy, M. Ray, R. Wyles, J. Wyles, A. Kennedy, J. Asbrock, N. Lum, C. Hewitt, D. Van Lue, J.Anderson, R. Chin, D. Bradley, T.Kostrzewa, "High Sensitivity 25 μm Microbolometer FPAs", Proceedings of SPIE, Vol. 4721, pp. 99-110, April 2002
10. D. Murphy, A. Kennedy, M. Ray, R. Wyles, J. Wyles, J. Asbrock, C. Hewitt, D. Van Lue, and T. Sessler J. Anderson, D. Bradley, R. Chin, H. Gonzales, C. Le Pere, and T. Kostrzewa, "Resolution and Sensitivity Improvements for microbolometer FPA", Proceedings of SPIE, Vol. 5074, pp. 402-413, April 2003
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12. D. Murphy, A. Kennedy, M. Ray, R. Wyles, J. Wyles, J. Asbrock, C. Hewitt, D. Van Lue, and T. Sessler J. Anderson, D. Bradley, R. Chin, H. Gonzales, C. Le Pere, and T. Kostrzewa, "Expanded Applications for high performance VOx Microbolometer FPAs", Proceedings of SPIE, Vol. 5783-49, pp. 448-459, April 2005