Amorphous silicon based large format uncooled FPA microbolometer technology

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6940, Issue , 2008, Pages

  Schimert, T ^a   Brady, J ^a   Fagan, T ^a   Taylor, M ^a   McCardel, W ^a   Gooch, R ^a   Ajmera, S ^a   Hanson, C ^a   Syllaios, A J ^a  

^a MS 37 ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

(OTDR) TECHNOLOGY; AMORPHOUS SILICON GERMANIUM; DETECTOR TECHNOLOGIES; FOCAL PLANE ARRAY (FPA) TECHNOLOGY; HIGH PERFORMANCE; HIGH RESOLUTIONS; HYDROGENATED AMORPHOUS SILICON (A-SI:H); INFRARED (IR); INFRARED TECHNOLOGIES; L-3 COMMUNICATIONS (CO); LARGE FORMATS; LOW POWERS; MATE RIAL PROPERTIES; MEGA PIXELS; MICRO(UNCOOLED) BOLOMETER; PIXEL DESIGNS; SILICON BASED; UNCOOLED FPA; WAFER LEVEL PACKAGE (WLP);

ARCHITECTURAL DESIGN; BOLOMETERS; COMPUTER NETWORKS; DETECTORS; FOCAL PLANE ARRAYS; FOCUSING; GERMANIUM; IMAGING TECHNIQUES; INFRARED RADIATION; IRIDIUM; NONMETALS; PIXELS; SEMICONDUCTOR MATERIALS; SILICON; SILICON WAFERS; TECHNOLOGY;

AMORPHOUS SILICON;

EID: 45549109773     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.784661     Document Type: Conference Paper

References (0)