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Volumn 44, Issue 3, 2009, Pages 977-986

Synchronous ultra-high-density 2RW dual-port 8T-SRAM with circumvention of simultaneous common-row-access

Author keywords

65 nm; CMOS; Dual port; Embedded SRAM; High density; Low power; Low voltage; Memory; Stability; Two port; Variability

Indexed keywords

CMOS INTEGRATED CIRCUITS; DYNAMIC POSITIONING; PERCOLATION (SOLID STATE);

EID: 61449171280     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2009.2013766     Document Type: Article
Times cited : (46)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.