Parallel scanning probe arrays: their applications

Materials Today

Volumn 11, Issue SUPPL., 2008, Pages 22-29

  Liu, Chang ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATERIALS SCIENCE; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

ATOMIC FORCE MICROSCOPES; ELECTROMAGNETICS; MATERIAL MODIFICATIONS; MATERIALS RESEARCHES; SCANNING PROBE ARRAYS; SCANNING PROBE INSTRUMENTS; SCANNING PROBES; SUBSTRATE INTERACTIONS; TUNNELING MICROSCOPES;

SCANNING;

EID: 58249143479     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(09)70004-5     Document Type: Review

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