Scanning thermal imaging microscopy using composite cantilever probes

Applied Physics Letters

Volumn , Issue , 1995, Pages 694-

  Nakabeppu, O ^a   Chandrachood, M ^a   Wu, Y ^a   Lai, J ^a   Majumdar, A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

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EID: 36449004953     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.114102     Document Type: Article

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