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Volumn 7, Issue 6, 2008, Pages 760-765

MESFETs made from individual GaN nanowires

Author keywords

GaN; MESFETs; Nanowires; Schottky barriers; Schottky diodes

Indexed keywords

DIODES; ELECTRIC WIRE; GALLIUM ALLOYS; GALLIUM NITRIDE; MESFET DEVICES; NANOWIRES; PLATINUM; SEMICONDUCTING GALLIUM; THRESHOLD LOGIC;

EID: 58149231283     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2008.2005492     Document Type: Article
Times cited : (73)

References (31)
  • 1
    • 0029275117 scopus 로고
    • GaN MESFETs for high-power and hightemperature microwave applications
    • Mar
    • M. W. Shin and R. J. Trew, "GaN MESFETs for high-power and hightemperature microwave applications," Electron. Lett., vol. 31, no. 6, pp. 498-500, Mar. 1995.
    • (1995) Electron. Lett , vol.31 , Issue.6 , pp. 498-500
    • Shin, M.W.1    Trew, R.J.2
  • 2
    • 33744534086 scopus 로고    scopus 로고
    • Polarization-resolved photoluminescence study of individual GaN nanowires grown by catalyst-free molecular beam epitaxy
    • May
    • J. B. Schlager, N. A. Sanford, K. A. Bertness, J. M. Barker, A. Roshko, and P. T. Blanchard, "Polarization-resolved photoluminescence study of individual GaN nanowires grown by catalyst-free molecular beam epitaxy," Appl. Phys. Lett., vol. 88, no. 21, pp. 213106-1-213106-3, May 2006.
    • (2006) Appl. Phys. Lett , vol.88 , Issue.21
    • Schlager, J.B.1    Sanford, N.A.2    Bertness, K.A.3    Barker, J.M.4    Roshko, A.5    Blanchard, P.T.6
  • 5
    • 33745025783 scopus 로고    scopus 로고
    • Selective-area growth and fabrication of recessed-gate GaN MESFET using plasma-assisted molecular beam epitaxy
    • May
    • S. J. Hong, P. Chapman, P. T. Krein, and K. Kim, "Selective-area growth and fabrication of recessed-gate GaN MESFET using plasma-assisted molecular beam epitaxy," Phys. Status Solidi A-Appl. Mater. Sci., vol. 203, no. 7, pp. 1872-1875, May 2006.
    • (2006) Phys. Status Solidi A-Appl. Mater. Sci , vol.203 , Issue.7 , pp. 1872-1875
    • Hong, S.J.1    Chapman, P.2    Krein, P.T.3    Kim, K.4
  • 6
    • 33746806779 scopus 로고    scopus 로고
    • Gallium nitride nanowire nonvolatile memory device
    • Jul
    • H. Y. Cha, H. Q. Wu, S. Chae, and M. G. Spencer, "Gallium nitride nanowire nonvolatile memory device," J. Appl. Phys., vol. 100, no. 2, pp. 024307-1-024307-4, Jul. 2006.
    • (2006) J. Appl. Phys , vol.100 , Issue.2
    • Cha, H.Y.1    Wu, H.Q.2    Chae, S.3    Spencer, M.G.4
  • 7
    • 33144458431 scopus 로고    scopus 로고
    • Fabrication and characterization of pre-aligned gallium nitride nanowire field-effect transistors
    • Mar
    • H. Y. Cha, H. Q. Wu, M. Chandrashekhar, Y. C. Choi, S. Chae, G. Koley, and M. G. Spencer, "Fabrication and characterization of pre-aligned gallium nitride nanowire field-effect transistors," Nanotechnology, vol. 17, no. 5, pp. 1264-1271, Mar. 2006.
    • (2006) Nanotechnology , vol.17 , Issue.5 , pp. 1264-1271
    • Cha, H.Y.1    Wu, H.Q.2    Chandrashekhar, M.3    Choi, Y.C.4    Chae, S.5    Koley, G.6    Spencer, M.G.7
  • 8
    • 33646737027 scopus 로고    scopus 로고
    • High-yield GaN nanowire synthesis and field-effect transistor fabrication
    • Apr
    • W. Huaqiang, C. Ho-Young, M. Chandrashekhar, M. G. Spencer, and G. Koley, "High-yield GaN nanowire synthesis and field-effect transistor fabrication," J. Electron. Mater., vol. 35, no. 4, pp. 670-674, Apr. 2006.
    • (2006) J. Electron. Mater , vol.35 , Issue.4 , pp. 670-674
    • Huaqiang, W.1    Ho-Young, C.2    Chandrashekhar, M.3    Spencer, M.G.4    Koley, G.5
  • 9
    • 33746323993 scopus 로고    scopus 로고
    • A study of dielectrophoretically aligned gallium nitride nanowires in metal electrodes and their electrical properties
    • Aug
    • S. Y Lee, T. H. Kim, D. I. Suh, N. K. Cho, H. K. Seong, S. W. Jung, H. J. Choi, and S. K. Lee, "A study of dielectrophoretically aligned gallium nitride nanowires in metal electrodes and their electrical properties," Chem. Phys. Lett., vol. 427, no. 1-3, pp. 107-112, Aug. 2006.
    • (2006) Chem. Phys. Lett , vol.427 , Issue.1-3 , pp. 107-112
    • Lee, S.Y.1    Kim, T.H.2    Suh, D.I.3    Cho, N.K.4    Seong, H.K.5    Jung, S.W.6    Choi, H.J.7    Lee, S.K.8
  • 10
    • 33846644090 scopus 로고    scopus 로고
    • Diameter dependent transport properties of gallium nitride nanowire field effect transistors
    • Jan
    • A. Motayed, M. Vaudin, A. V. Davydov, J. Melngailis, H. Maoqi, and S. N. Mohammad, "Diameter dependent transport properties of gallium nitride nanowire field effect transistors," Appl. Phys. Lett., vol. 90, no. 4, pp. 043104-1-043104-3, Jan. 2007.
    • (2007) Appl. Phys. Lett , vol.90 , Issue.4
    • Motayed, A.1    Vaudin, M.2    Davydov, A.V.3    Melngailis, J.4    Maoqi, H.5    Mohammad, S.N.6
  • 11
    • 33846585724 scopus 로고    scopus 로고
    • Direct electrical characteristics of GaN nanowire field effect transistor (FET) without assistance of e-beam lithography (EBL)
    • L. Sang-Kwon, S. Han-Kyu, C. Ki-Chul, C. Nam-Kyu, C. Heon-Jin, S. Eun-Kyung, and N. Kee-Suk, "Direct electrical characteristics of GaN nanowire field effect transistor (FET) without assistance of e-beam lithography (EBL)," Mater. Sci. Forum, vol. 527-529, pp. 1549-1552, 2006.
    • (2006) Mater. Sci. Forum , vol.527-529 , pp. 1549-1552
    • Sang-Kwon, L.1    Han-Kyu, S.2    Ki-Chul, C.3    Nam-Kyu, C.4    Heon-Jin, C.5    Eun-Kyung, S.6    Kee-Suk, N.7
  • 15
    • 0000823384 scopus 로고    scopus 로고
    • Gallium nitride nanowire nanodevices
    • Feb
    • H. Yu, D. Xiangfeng, C. Yi, and C. M. Lieber, "Gallium nitride nanowire nanodevices," Nano Lett., vol. 2, no. 2, pp. 101-104, Feb. 2002.
    • (2002) Nano Lett , vol.2 , Issue.2 , pp. 101-104
    • Yu, H.1    Xiangfeng, D.2    Yi, C.3    Lieber, C.M.4
  • 16
    • 34247533736 scopus 로고    scopus 로고
    • High-performance nano-Schottky diodes and nano-MESFETs made on single CdS nanobelts
    • Apr
    • R. M. Ma, L. Dai, and G. G. Qin, "High-performance nano-Schottky diodes and nano-MESFETs made on single CdS nanobelts," Nano Lett., vol. 7, no. 4, pp. 868-873, Apr. 2007.
    • (2007) Nano Lett , vol.7 , Issue.4 , pp. 868-873
    • Ma, R.M.1    Dai, L.2    Qin, G.G.3
  • 17
    • 20444449735 scopus 로고    scopus 로고
    • ZnO nanorod logic circuits
    • Jun
    • W. I. Park, J. S. Kim, G. C. Yi, and H. J. Lee, "ZnO nanorod logic circuits," Adv. Mater., vol. 17, no. 11, pp. 1393-1397, Jun. 2005.
    • (2005) Adv. Mater , vol.17 , Issue.11 , pp. 1393-1397
    • Park, W.I.1    Kim, J.S.2    Yi, G.C.3    Lee, H.J.4
  • 18
    • 33746832816 scopus 로고    scopus 로고
    • Fabrication of GaN-based nanoscale device structures utilizing focused ion beam induced Pt deposition
    • Jul
    • A. Motayed, A. V. Davydov, M. D. Vaudin, I. Levin, J. Melngailis, and S. N. Mohammad, "Fabrication of GaN-based nanoscale device structures utilizing focused ion beam induced Pt deposition," J. Appl. Phys., vol. 100, no. 2, pp. 024306-1-024306-8, Jul. 2006.
    • (2006) J. Appl. Phys , vol.100 , Issue.2
    • Motayed, A.1    Davydov, A.V.2    Vaudin, M.D.3    Levin, I.4    Melngailis, J.5    Mohammad, S.N.6
  • 20
    • 0036801206 scopus 로고    scopus 로고
    • Schottky diodes based on a single GaN nanowire
    • Oct
    • J. R. Kim, H. Oh, H. M. So, J. J. Kim, J. Kim, C. J. Lee, and S. C. Lyu, "Schottky diodes based on a single GaN nanowire," Nanotechnology, vol. 13, no. 5, pp. 701-704, Oct. 2002.
    • (2002) Nanotechnology , vol.13 , Issue.5 , pp. 701-704
    • Kim, J.R.1    Oh, H.2    So, H.M.3    Kim, J.J.4    Kim, J.5    Lee, C.J.6    Lyu, S.C.7
  • 23
    • 3343020989 scopus 로고    scopus 로고
    • Effects of oxygen plasma treatments on the formation of ohmic contacts to GaN
    • Jul
    • J. Yan, M. J. Kappers, Z. H. Barber, and C. J. Humphreys, "Effects of oxygen plasma treatments on the formation of ohmic contacts to GaN," Appl. Surf. Sci., vol. 234, no. 1-4, pp. 328-332, Jul. 2004.
    • (2004) Appl. Surf. Sci , vol.234 , Issue.1-4 , pp. 328-332
    • Yan, J.1    Kappers, M.J.2    Barber, Z.H.3    Humphreys, C.J.4
  • 24
    • 0141988626 scopus 로고    scopus 로고
    • Electrical and chemical characterization of the Schottky barrier formed between clean n-GaN(0001) surfaces and Pt, Au, and Ag
    • Sep
    • K. M. Tracy, P. J. Hartlieb, S. Einfeldt, R. F. Davis, E. H. Hurt, and R. J. Nemanich, "Electrical and chemical characterization of the Schottky barrier formed between clean n-GaN(0001) surfaces and Pt, Au, and Ag," J. Appl. Phys., vol. 94, no. 6, pp. 3939-3948, Sep. 2003.
    • (2003) J. Appl. Phys , vol.94 , Issue.6 , pp. 3939-3948
    • Tracy, K.M.1    Hartlieb, P.J.2    Einfeldt, S.3    Davis, R.F.4    Hurt, E.H.5    Nemanich, R.J.6
  • 26
    • 0000113985 scopus 로고    scopus 로고
    • Explanation of the linear correlation between barrier heights and ideality factors of real metalsemiconductor contacts by laterally nonuniform Schottky barriers
    • Jul.-Aug
    • R. F. Schmitsdorf, T. U. Kampen, and W. Monch, "Explanation of the linear correlation between barrier heights and ideality factors of real metalsemiconductor contacts by laterally nonuniform Schottky barriers," J. Vac. Sci. Technol. B, vol. 15, no. 4, pp. 1221-1226, Jul.-Aug. 1997.
    • (1997) J. Vac. Sci. Technol. B , vol.15 , Issue.4 , pp. 1221-1226
    • Schmitsdorf, R.F.1    Kampen, T.U.2    Monch, W.3
  • 28
    • 33750178791 scopus 로고    scopus 로고
    • Highperformance, hysteresis-free carbon nanotube field-effect transistors via directed assembly
    • Oct
    • S. A. McGill, S. G. Rao, P. Manandhar, X. Peng, and H. Seunghun, "Highperformance, hysteresis-free carbon nanotube field-effect transistors via directed assembly," Appl. Phys. Lett., vol. 89, no. 16, pp. 163123-1-163123-3, Oct. 2006.
    • (2006) Appl. Phys. Lett , vol.89 , Issue.16
    • McGill, S.A.1    Rao, S.G.2    Manandhar, P.3    Peng, X.4    Seunghun, H.5
  • 29
    • 0042948502 scopus 로고    scopus 로고
    • Hysteresis caused by water molecules in carbon nanotube field-effect transistors
    • Feb
    • K. Woong, A. Javey, O. Vermesh, W. Qian, L. Yiming, and D. Hongjie, "Hysteresis caused by water molecules in carbon nanotube field-effect transistors," Nano Lett., vol. 3, no. 2, pp. 193-198, Feb. 2003.
    • (2003) Nano Lett , vol.3 , Issue.2 , pp. 193-198
    • Woong, K.1    Javey, A.2    Vermesh, O.3    Qian, W.4    Yiming, L.5    Hongjie, D.6
  • 30
    • 33645657394 scopus 로고    scopus 로고
    • Electronic transport and Schottky barrier heights of Ni/Au contacts on n-type GaN surface with and without a thin native oxide layer
    • Apr
    • Y J. Lin, W. X. Lin, C. T. Lee, and H. C. Chang, "Electronic transport and Schottky barrier heights of Ni/Au contacts on n-type GaN surface with and without a thin native oxide layer," Jpn. J. Appl. Phys., vol. 45, no. 4A, pp. 2505-2508, Apr. 2006.
    • (2006) Jpn. J. Appl. Phys , vol.45 , Issue.4 A , pp. 2505-2508
    • Lin, Y.J.1    Lin, W.X.2    Lee, C.T.3    Chang, H.C.4
  • 31
    • 33847753885 scopus 로고    scopus 로고
    • Schottky mechanism for Ni/Au contact with chlorine-treated n-type GaN layer
    • Jan
    • P.S. Chen, T. H. Lee, L. W. Lai, and C. T. Lee, "Schottky mechanism for Ni/Au contact with chlorine-treated n-type GaN layer," J. Appl. Phys., vol. 101, no. 2, pp. 024507-1-024507-4, Jan. 2007.
    • (2007) J. Appl. Phys , vol.101 , Issue.2
    • Chen, P.S.1    Lee, T.H.2    Lai, L.W.3    Lee, C.T.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.