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Applied Physics Letters

Volumn 93, Issue 22, 2008, Pages

Temperature dependence of the current conduction mechanisms in LaAlO 3 thin films

(2) Chang, Ingram Yin Ku a Lee, Joseph Ya Min a

a NATIONAL TSING HUA UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRAPPING; DIELECTRIC DEVICES; DIELECTRIC FILMS; ELECTRON TUBE DIODES; HEAT CONDUCTION; LANTHANUM ALLOYS; MOS CAPACITORS; MOS DEVICES; OXIDE FILMS; THICK FILMS;

BARRIER HEIGHTS; CONDUCTION MECHANISMS; CURRENT CONDUCTION MECHANISMS; ELECTRONIC MASSES; POSTDEPOSITION ANNEALING; SCHOTTKY EMISSIONS; SEMICONDUCTOR CAPACITORS; SPACE-CHARGE-LIMITED CURRENTS; TEMPERATURE DEPENDENCES; TEMPERATURE RANGES;

AMORPHOUS FILMS;

EID: 57349142366 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3039074 Document Type: Article

Times cited : (20)

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