Electrical conduction mechanisms of metal La2 O3 Si structure

Journal of Applied Physics

Volumn 97, Issue 10, 2005, Pages

  Chiu, Fu Chien ^a   Chou, Hong Wen ^a   Lee, Joseph Ya Min ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL CONDUCTION; ELECTRONIC MOBILITY; ROOM TEMPERATURE; TRAP DENSITY;

CAPACITANCE; DIELECTRIC FILMS; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ENERGY DISPERSIVE SPECTROSCOPY; LANTHANUM COMPOUNDS; MAGNETRON SPUTTERING; MOS CAPACITORS; PERMITTIVITY; SILICON; TEMPERATURE DISTRIBUTION; TRANSMISSION ELECTRON MICROSCOPY;

METALS;

EID: 20944450556     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1896435     Document Type: Article

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