Temperature dependence of the current conduction mechanisms in ferroelectric Pb(Zr0.53,Ti0.47)O3 thin films

Journal of Applied Physics

Volumn 95, Issue 6, 2004, Pages 3120-3125

  Juan, Trevor Pi Chun ^a   Chen, Si Min ^a   Lee, Joseph Ya Min ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC BREAKDOWN; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTROCHEMICAL ELECTRODES; ELECTRON TRAPS; ELLIPSOMETRY; HIGH TEMPERATURE APPLICATIONS; LEAD COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

SCHOTTKY EMISSIONS; THIN FILM CAPACITORS; VALENCE BANDS;

FERROELECTRIC THIN FILMS;

EID: 1842426436     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1646441     Document Type: Article

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